LED Inspection


LED Inspection - Precision Images for Advanced Assembly

Glenbrook X-ray systems can be used to look for bad welds, broken wires, solder voids, broken wire bonds etc., on LED Solid State illuminating products and Incandecent bulbs.

led xray inspection Counterfeit detection 2

Good Led Viewed Under X-ray

Voids Indentified on Led Device

A good LED image viewed on a JewelBox fluoroscopic X-ray system with a GTI-5000 software package. The image below showing one part of the void measurement feature. Selected item passed inspection based on set parameters.

led xray inspection

The RTX-113 Micro-30, JewelBox-70T & Ultra-Compact can be used for LED inspection.


RTX-113 Micro-30
RTX-113 Micro-30™

Smaller Focal Spot for High Resolution Requirements such as Small Hole Drilling, Micro BGA and QFN Inspection

The new RTX-113 Micro 30 X-ray Inspection System, with enormous capability, is compact enough to fit in a lab or on the production floor. The system employs a pc controlled 40 to 80 kV x-ray tube with 30 micron focal spot and our patented XRTV x-ray camera technology now enhanced with Crystal X Imaging for higher contrast. This combination advances our RTX Series for higher resolution and magnification requirements allowing up to 100x geometric and 225x optical magnification.



JewelBox 70T
JewelBox-70T™

High Magnification X-ray Inspection of Electronic Assemblies

The JewelBox-70T delivers superior image quality with excellent resolution and sensitivity for laboratory and failure analysis applications. The system's 10-micron MicroTech™ x-ray source provides magnification from 7X to 2000X, with resolution of 100 line pairs/mm.





JewelBox Ultra-Compact
Ultra-Compact™

Compact, Desktop Version of the JewelBox

Glenbrook Technologies redefines X-ray Inspection with our smallest JewelBox Micro focus x-ray system yet. With dimensions of just 22”W x 26”L, it’s small enough to fit on a standard desk, in an office or small lab. But it’s big in capabilities with >500x magnification ,5 axis manipulator and advanced image processing.




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